Package org.rcsb.cif.model.generated

Class EmFocusedIonBeam

java.lang.Object

org.rcsb.cif.model.BaseCategory

org.rcsb.cif.model.generated.EmFocusedIonBeam

All Implemented Interfaces:

Category

@Generated("org.rcsb.cif.generator.SchemaGenerator")
public class EmFocusedIonBeam
extends BaseCategory

Description of sectioning by focused_ion_beam

Field Summary

Fields inherited from class org.rcsb.cif.model.BaseCategory

isText, textFields

Constructor Summary

Constructors

Constructor	Description
EmFocusedIonBeam(String name)
EmFocusedIonBeam(String name, int rowCount, Object[] encodedColumns)
EmFocusedIonBeam(String name, Map<String,Column> columns)

Method Summary

Modifier and Type	Method	Description
FloatColumn	getCurrent()	Current of the ion beam, in nanoamperes (nA)
StrColumn	getDetails()	Additional details about FIB milling
IntColumn	getDoseRate()	ions per sq centimetre per second
IntColumn	getDuration()	Milling time in seconds (is seconds most appropriate unit?)
StrColumn	getEmTomographySpecimenId()	Foreign key relationship to the EM TOMOGRAPHY SPECIMEN category
IntColumn	getFinalThickness()	Final sample thickness
StrColumn	getId()	This data item is the primary key of the category.
IntColumn	getInitialThickness()	Initial sample thickness
StrColumn	getInstrument()	The instrument used for focused ion beam sectioning
StrColumn	getIon()	The ion source used to ablate the specimen
IntColumn	getTemperature()	Temperature of the sample during milling, in degrees Kelvin
IntColumn	getVoltage()	Voltage applied to the ion source, in kilovolts

Methods inherited from class org.rcsb.cif.model.BaseCategory

getBinaryColumn, getCategoryName, getColumn, getColumnNames, getRowCount, isDefined

Methods inherited from class java.lang.Object

clone, equals, finalize, getClass, hashCode, notify, notifyAll, toString, wait, wait, wait

Methods inherited from interface org.rcsb.cif.model.Category

columnNames, columns, get

Constructor Detail

EmFocusedIonBeam

public EmFocusedIonBeam(String name,
                        Map<String,Column> columns)

EmFocusedIonBeam

public EmFocusedIonBeam(String name,
                        int rowCount,
                        Object[] encodedColumns)

EmFocusedIonBeam

public EmFocusedIonBeam(String name)

Method Detail

getCurrent

public FloatColumn getCurrent()

Current of the ion beam, in nanoamperes (nA)

Returns:

FloatColumn

getDetails

public StrColumn getDetails()

Additional details about FIB milling

Returns:

StrColumn

getDoseRate

public IntColumn getDoseRate()

ions per sq centimetre per second

Returns:

IntColumn

getDuration

public IntColumn getDuration()

Milling time in seconds (is seconds most appropriate unit?)

Returns:

IntColumn

getEmTomographySpecimenId

public StrColumn getEmTomographySpecimenId()

Foreign key relationship to the EM TOMOGRAPHY SPECIMEN category

Returns:

StrColumn

getFinalThickness

public IntColumn getFinalThickness()

Final sample thickness

Returns:

IntColumn

getId

public StrColumn getId()

This data item is the primary key of the category.

Returns:

StrColumn

getInitialThickness

public IntColumn getInitialThickness()

Initial sample thickness

Returns:

IntColumn

getInstrument

public StrColumn getInstrument()

The instrument used for focused ion beam sectioning

Returns:

StrColumn

getIon

public StrColumn getIon()

The ion source used to ablate the specimen

Returns:

StrColumn

getTemperature

public IntColumn getTemperature()

Temperature of the sample during milling, in degrees Kelvin

Returns:

IntColumn

getVoltage

public IntColumn getVoltage()

Voltage applied to the ion source, in kilovolts

Returns:

IntColumn