Class DiffrnMeasurement

  • All Implemented Interfaces:
    Category

    @Generated("org.rcsb.cif.generator.SchemaGenerator")
    public class DiffrnMeasurement
    extends BaseCategory
    Data items in the DIFFRN_MEASUREMENT category record details about the device used to orient and/or position the crystal during data measurement and the manner in which the diffraction data were measured.
    • Constructor Detail

      • DiffrnMeasurement

        public DiffrnMeasurement​(String name,
                                 int rowCount,
                                 Object[] encodedColumns)
      • DiffrnMeasurement

        public DiffrnMeasurement​(String name)
    • Method Detail

      • getDiffrnId

        public StrColumn getDiffrnId()
        This data item is a pointer to _diffrn.id in the DIFFRN category.
        Returns:
        StrColumn
      • getDetails

        public StrColumn getDetails()
        A description of special aspects of the intensity measurement.
        Returns:
        StrColumn
      • getDevice

        public StrColumn getDevice()
        The general class of goniometer or device used to support and orient the specimen.
        Returns:
        StrColumn
      • getDeviceDetails

        public StrColumn getDeviceDetails()
        A description of special aspects of the device used to measure the diffraction intensities.
        Returns:
        StrColumn
      • getDeviceType

        public StrColumn getDeviceType()
        The make, model or name of the measurement device (goniometer) used.
        Returns:
        StrColumn
      • getMethod

        public StrColumn getMethod()
        Method used to measure intensities.
        Returns:
        StrColumn
      • getSpecimenSupport

        public StrColumn getSpecimenSupport()
        The physical device used to support the crystal during data collection.
        Returns:
        StrColumn
      • getPdbxDate

        public StrColumn getPdbxDate()
        The date of data measurement
        Returns:
        StrColumn