Class CellMeasurementRefln

  • All Implemented Interfaces:
    Category

    @Generated("org.rcsb.cif.generator.SchemaGenerator")
    public class CellMeasurementRefln
    extends BaseCategory
    Data items in the CELL_MEASUREMENT_REFLN category record details about the reflections used to determine the crystallographic cell parameters. The CELL_MEASUREMENT_REFLN data items would in general be used only for diffractometer data.
    • Constructor Detail

      • CellMeasurementRefln

        public CellMeasurementRefln​(String name,
                                    int rowCount,
                                    Object[] encodedColumns)
      • CellMeasurementRefln

        public CellMeasurementRefln​(String name)
    • Method Detail

      • getIndexH

        public IntColumn getIndexH()
        Miller index h of a reflection used for measurement of the unit cell.
        Returns:
        IntColumn
      • getIndexK

        public IntColumn getIndexK()
        Miller index k of a reflection used for measurement of the unit cell.
        Returns:
        IntColumn
      • getIndexL

        public IntColumn getIndexL()
        Miller index l of a reflection used for measurement of the unit cell.
        Returns:
        IntColumn
      • getTheta

        public FloatColumn getTheta()
        Theta angle for a reflection used for measurement of the unit cell in degrees.
        Returns:
        FloatColumn